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RIS citation export for TUPP043: Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams

TY  - CONF
AU  - Andonian, G.
AU  - Campese, T.J.
AU  - Gubeli, J.
AU  - Huff, C.F.
AU  - Jordan, K.
AU  - Laurich, A.
AU  - Penney, J.K.
AU  - Ruelas, M.
AU  - Scammell, L.R.
AU  - Whitney, R.R.
AU  - Yan, J.
ED  - Schaa, Volker RW
ED  - Jansson, Andreas
ED  - Shea, Thomas
ED  - Olander, Johan
TI  - Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams
J2  - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019
CY  - Malmö, Sweden
T2  - International Beam Instrumentation Conferenc
T3  - 8
LA  - english
AB  - Wire scanners are robust devices for beam characterization in accelerator facilities. However, prolonged usage with intense particle beams leads to wire damage, requiring replacement and beam diagnostic downtime. The fast, robust wire scanner was recently designed and engineered with swappable and modular wire cards, that can accommodate different wire materials under tension. Testing is currently underway at the Jefferson Laboratory (JLab) Low Energy Recirculating Facility. During the course of the diagnostic development and commissioning, we will test Tungsten, Carbon, and boron-nitride nanotube in wire form. The latter is particularly relevant as early results on the material show that it has very high thermal thresholds and may withstand the high-power of the beam during regular operations. This paper will report on the system design and engineering, and preliminary results with operation on the beamline.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 433
EP  - 435
KW  - operation
KW  - controls
KW  - detector
KW  - diagnostics
KW  - laser
DA  - 2019/11
PY  - 2019
SN  - 978-3-95450-204-2
DO  - doi:10.18429/JACoW-IBIC2019-TUPP043
UR  - http://jacow.org/ibic2019/papers/tupp043.pdf
ER  -