|TUBO02||FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.||243|
Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
|Slides TUBO02 [10.551 MB]|
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02|
|About •||paper received ※ 04 September 2019 paper accepted ※ 07 September 2019 issue date ※ 10 November 2019|
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