Author: Guzenko, V.
Paper Title Page
TUBO02 FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements. 243
 
  • G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat
    PSI, Villigen PSI, Switzerland
  • N. Cefarin, S. Dal Zilio, M. Lazzarino
    IOM-CNR, Trieste, Italy
  • M. Ferianis, G. Penco, M. Veronese
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
 
  Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
 
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DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02  
About • paper received ※ 04 September 2019       paper accepted ※ 07 September 2019       issue date ※ 10 November 2019  
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WEPP009
Measurement of Electron Pulse Length at 35 MeV Using a Terahertz Split Ring Resonator  
 
  • X.Y. Liu
    USTC/NSRL, Hefei, Anhui, People’s Republic of China
  • M.M. Dehler, V. Guzenko, R. Ischebeck, X.Y. Liu, C. Lombosi, V. Schlott
    PSI, Villigen PSI, Switzerland
  • T. Feurer, M. Hayati, Z. Ollmann
    Universität Bern, Institute of Applied Physics, Bern, Switzerland
  • V. Georgiadis, D.M. Graham, M.T. Hibberd
    The University of Manchester, The Photon Science Institute, Manchester, United Kingdom
  • A.L. Healy, S.P. Jamison
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • D. Lake
    University of Manchester, Manchester, United Kingdom
  • T.H. Pacey
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • D. Rohrbach
    University of Bern, Bern, Switzerland
 
  Funding: This work was supported by the European Union’s Horizon 2020 Research and Innovation Programme (730871). X.Y. Liu was supported by China Scholarship Council for a 2-year study at PSI (201706340057).
The resolution of a streak camera system strongly depends on the slew rate of the deflecting element, which is the product of the amplitude and frequency of the device. An attractive approach towards femtosecond and sub-femtosecond range consists in using terahertz-driven devices, which offer a good combination of high frequency and high gradient-gradients of GV/m have been demonstrated in split ring resonator using pulse created by rectifying ultrashort laser pulses. We present results obtained from a beam experiment at the VELA facility at Daresbury laboratory. We tested a planar resonator derived from the geometry of a split ring resonator with an aperture for the beam of 20 um.
Email address: xiaoyu.liu@psi.ch
 
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