Author: Ischebeck, R.
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MOPP046
Electron Beam Diagnostics for SLS2.0  
 
  • C. Ozkan Loch, R. Ischebeck, G.L. Orlandi, V. Schlott, A. Streun
    PSI, Villigen PSI, Switzerland
 
  In the near future the SLS storage ring will be upgraded for significantly higher brightness and coherence. Although the upgrade will require similar instrumentation to that already implemented for current SLS operation, significant changes in the number of devices, their specifications and their technical realizations will have to be made according to the specific requirements of SLS 2.0, using the newly available technologies and standardizations at PSI. This poster will provide an overview of the design, technical specifications, implementation and expected challenges of these systems. The beam position monitors and fast-orbit feedbacks are not included in this presentation.  
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TUBO01
Screen materials for high precision measurements  
 
  • B. Walasek-Höhne, P. Forck
    GSI, Darmstadt, Germany
  • R. Ischebeck
    PSI, Villigen PSI, Switzerland
  • G. Kube
    DESY, Hamburg, Germany
 
  Funding: This project has received funding from the European Union’s Horizon 2020 programme under Grant Agreement No 730871.
Scintillation screens made of various inorganic materials are widely used for transverse beam profile diagnostics at all kinds of accelerators. The monitor principle is based on the particles’ energy loss and its conversion to visible light. The resulting light spot is a direct image of the two-dimensional beam distribution. For large beam sizes standard optical techniques can be applied, while for small beam sizes dedicated optical arrangements have to be used to prevent for image deformations. In the modern linac based light sources scintillator usage serves as an alternative way to overcome limitations related to coherent OTR emission. Radiation damages and intensity based saturation effects, in dependence of the screen material, have to be modelled. In this talk, an introduction to the scintillation mechanism in inorganic materials will be given including practical demands and limitations. An overview on actual applications at hadron and electron accelerators will be discussed as summary of the Joint ARIES-ADA Workshop on ’Scintillation Screens and Optical Technology for transverse Profile Measurements’ held in Kraków, Poland.
 
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TUBO02 FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements. 243
 
  • G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat
    PSI, Villigen PSI, Switzerland
  • N. Cefarin, S. Dal Zilio, M. Lazzarino
    IOM-CNR, Trieste, Italy
  • M. Ferianis, G. Penco, M. Veronese
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
 
  Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
 
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DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02  
About • paper received ※ 04 September 2019       paper accepted ※ 07 September 2019       issue date ※ 10 November 2019  
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WEPP009
Measurement of Electron Pulse Length at 35 MeV Using a Terahertz Split Ring Resonator  
 
  • X.Y. Liu
    USTC/NSRL, Hefei, Anhui, People’s Republic of China
  • M.M. Dehler, V. Guzenko, R. Ischebeck, X.Y. Liu, C. Lombosi, V. Schlott
    PSI, Villigen PSI, Switzerland
  • T. Feurer, M. Hayati, Z. Ollmann
    Universität Bern, Institute of Applied Physics, Bern, Switzerland
  • V. Georgiadis, D.M. Graham, M.T. Hibberd
    The University of Manchester, The Photon Science Institute, Manchester, United Kingdom
  • A.L. Healy, S.P. Jamison
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • D. Lake
    University of Manchester, Manchester, United Kingdom
  • T.H. Pacey
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • D. Rohrbach
    University of Bern, Bern, Switzerland
 
  Funding: This work was supported by the European Union’s Horizon 2020 Research and Innovation Programme (730871). X.Y. Liu was supported by China Scholarship Council for a 2-year study at PSI (201706340057).
The resolution of a streak camera system strongly depends on the slew rate of the deflecting element, which is the product of the amplitude and frequency of the device. An attractive approach towards femtosecond and sub-femtosecond range consists in using terahertz-driven devices, which offer a good combination of high frequency and high gradient-gradients of GV/m have been demonstrated in split ring resonator using pulse created by rectifying ultrashort laser pulses. We present results obtained from a beam experiment at the VELA facility at Daresbury laboratory. We tested a planar resonator derived from the geometry of a split ring resonator with an aperture for the beam of 20 um.
Email address: xiaoyu.liu@psi.ch
 
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WEPP026 Electron Bunch Compression Monitors for Short Bunches - Commissioning Results from SwissFEL 571
 
  • F. Frei, R. Ischebeck
    PSI, Villigen PSI, Switzerland
 
  In SwissFEL, by using three magnetic chicanes, 3ps long electron bunches can by compressed by a factor of more than 100 down to a few fs in order to generate ultra short X-ray pulses. In order to meet the envisaged beam performance, noninvasive longitudinal diagnostic after each compression stage is essential. These bunch compression monitors measure relative bunch length changes on a shot-to-shot basis by detecting coherent edge, synchrotron or diffraction radiation emitted by the electron bunches. While after the first two magnetic chicanes, a wide spectral part is integrated on a single broadband detector, an infrared spectrometer installed after the third magnetic chicane is providing more detailed information. Here, we will mainly report on commissioning results of the third bunch compression monitor for electron bunches of a few fs.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-WEPP026  
About • paper received ※ 03 September 2019       paper accepted ※ 10 September 2019       issue date ※ 10 November 2019  
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