Author: Loisch, G.
Paper Title Page
TUPP013 Slit-Based Slice Emittance Measurements Optimization at PITZ 313
  • R. Niemczyk, P. Boonpornprasert, Y. Chen, J.D. Good, M. Groß, H. Huck, I.I. Isaev, C. Koschitzki, M. Krasilnikov, S. Lal, X. Li, O. Lishilin, G. Loisch, D. Melkumyan, A. Oppelt, H.J. Qian, H. Shaker, G. Shu, F. Stephan, G. Vashchenko
    DESY Zeuthen, Zeuthen, Germany
  • W. Hillert
    University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
  At the Photo Injector Test Facility at DESY in Zeuthen (PITZ) high-brightness electron sources are optimized for use at the X-ray free-electron lasers FLASH and European XFEL. Transverse projected emittance measurements are carried out by a single-slit scan technique in order to suppress space charge effects at an energy of ~20 MeV. Previous slice emittance measurements, which employed the emittance measurement in conjunction with a transverse deflecting structure, suffer from limited time resolution and low signal-to-noise ratio (SNR) due to a long drift space from the mask to the observation screen. Recent experimental studies at PITZ show improvement of the temporal resolution and SNR by utilizing quadrupole magnets between the mask and the screen. The measurement setup is described and first results are shown.  
DOI • reference for this paper ※  
About • paper received ※ 26 August 2019       paper accepted ※ 09 September 2019       issue date ※ 10 November 2019  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)