Author: Penco, G.
Paper Title Page
TUBO02 FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements. 243
 
  • G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat
    PSI, Villigen PSI, Switzerland
  • N. Cefarin, S. Dal Zilio, M. Lazzarino
    IOM-CNR, Trieste, Italy
  • M. Ferianis, G. Penco, M. Veronese
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
 
  Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
 
slides icon Slides TUBO02 [10.551 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02  
About • paper received ※ 04 September 2019       paper accepted ※ 07 September 2019       issue date ※ 10 November 2019  
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TUPP014 New Combined Function Wire Scanner-Screen Station for the High Resolution Transverse Profile Measurements at FERMI 317
 
  • M. Veronese, A. Abrami, M. Bossi, M. Ferianis, S. Grulja, G. Penco, M. Tudor
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
 
  We present the upgrade of the transverse profile diagnostics at the end of the FERMI Linac with a new high resolution instrumentation with the aim of improving the accuracy of the measurement of the twiss parameters and of the emittance. A scintillating screen, has been adopted instead of OTR screen due to known COTR issues. We used the same COTR suppression geometry that we had already implemented on our intra undulator screens and YAG:Ce as scintillating material. Screen based transverse profile diagnostics provide single shot measurements with a typical resolution of the order of tens of microns mainly due to refraction effects, geometry and other physical material properties. To extend the resolution to the micron level needed in case of low charge operation, we have equipped the same vacuum chamber with a wire scanner housing 10 micron tungsten wires. This paper describes the design and the first operational experience with the new device and discusses advantages as well as limitations.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUPP014  
About • paper received ※ 04 September 2019       paper accepted ※ 09 September 2019       issue date ※ 10 November 2019  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)