Author: Scammell, L.R.
Paper Title Page
TUPP043 Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams 433
  • G. Andonian, T.J. Campese, A. Laurich, M. Ruelas
    RadiaBeam, Marina del Rey, California, USA
  • G. Andonian, J.K. Penney
    UCLA, Los Angeles, California, USA
  • J. Gubeli, K. Jordan, J. Yan
    JLab, Newport News, Virginia, USA
  • C.F. Huff, L.R. Scammell, R.R. Whitney
    BNNT, LLC, Newport News, USA
  Wire scanners are robust devices for beam characterization in accelerator facilities. However, prolonged usage with intense particle beams leads to wire damage, requiring replacement and beam diagnostic downtime. The fast, robust wire scanner was recently designed and engineered with swappable and modular wire cards, that can accommodate different wire materials under tension. Testing is currently underway at the Jefferson Laboratory (JLab) Low Energy Recirculating Facility. During the course of the diagnostic development and commissioning, we will test Tungsten, Carbon, and boron-nitride nanotube in wire form. The latter is particularly relevant as early results on the material show that it has very high thermal thresholds and may withstand the high-power of the beam during regular operations. This paper will report on the system design and engineering, and preliminary results with operation on the beamline.  
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About • paper received ※ 05 September 2019       paper accepted ※ 10 September 2019       issue date ※ 10 November 2019  
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