THAO —  Novel Techniques and Technologies   (12-Sep-19   09:00—10:30)
Chair: T. Lefevre, CERN, Meyrin, Switzerland
Paper Title Page
THAO01 Cherenkov Diffraction Radiation as a tool for beam diagnostics -1
 
  • T. Lefèvre, D. Alves, M. Bergamaschi, A. Curcio, O.R. Jones, R. Kieffer, S. Mazzoni, N. Mounet, A. Schlogelhofer, E. Senes
    CERN, Meyrin, Switzerland
  • M. Apollonio, L. Bobb
    DLS, Oxfordshire, United Kingdom
  • A. Aryshev, N. Terunuma
    KEK, Ibaraki, Japan
  • M.G. Billing, Y.L. Bordlemay Padilla, J.V. Conway, J.P. Shanks
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • V.V. Bleko, S.Yu. Gogolev, A.S. Konkov, J.S. Markova, A. Potylitsyn, D.A. Shkitov
    TPU, Tomsk, Russia
  • K.V. Fedorov, D.M. Harryman, P. Karataev, K. Lekomtsev
    JAI, Egham, Surrey, United Kingdom
  • J. Gardelle
    CEA, LE BARP cedex, France
  • K. Łasocha
    Marian Smoluchowski Institute of Physics, Jagiellonian University, Kraków, Poland
 
  During the last three years, the emission of Cherenkov Diffraction Radiation (ChDR), appearing when a relativistic charged particle moves in the vicinity of a dielectric medium, has been investigated with the aim of providing non-invasive beam diagnostics. ChDR has very interesting properties, with a large number of photons emitted in a narrow and well-defined solid angle, providing excellent conditions for detection with very little background. This contribution will present a collection of recent beam measurements performed at several facilities such as the Cornell Electron Storage Ring, the Advanced Test Facility 2 at KEK, the Diamond light source in the UK and the CLEAR test facility at CERN. Those results, complemented with simulations, suggest that the use of both incoherent and coherent emission of Cherenkov diffraction radiation could open up new beam instrumentation possibilities for relativistic charged particle beams.  
slides icon Slides THAO01 [10.658 MB]  
 
THAO02 Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring -1
 
  • M. Camarda, M. Birri, M. Carullapresenter, D. Grolimund, B. Meyer, C. Pradervand
    PSI, Villigen PSI, Switzerland
  • U. Grossner, S.M. Nida, A. Tsibizov, T. Ziemann
    ETH, Zurich, Switzerland
 
  In this work, we present extensive theoretical and experimental results of novel Silicon Carbide x-ray sensors for beam position monitoring (XBPM). Until recently, diamond, was considered the material-of-choice for continuous monitoring of hard (>6keV) x-ray beams at synchrotron light sources. Diamond XBPM are now commercially available as single crystal* and polycrystalline** sensors. However, in a recently published paper***, we have shown that Silicon Carbide is superior to both diamond crystal types in several critical aspects. Specifically, we found superior electrical characteristics (sensor dynamics, signal uniformity, signal strength) and superior optical properties (full device transparency, device active area, signal strength) when compared to commercial polycrystalline and single crystal diamond, respectively. We also succeeded in the ’industrialization’ of the SiC fabrication process, allowing for the simultaneous realization of several (>40) sensors in up to 4’ SiC wafers, with high yields. More recently we have also analyzed the fluorescence of SiC sensors as compared to YAG ones, finding that SiC can also be used for hybrid position/shape monitoring schema.
* CIVIDEC. AT, SYDORTECHNOLOGIES. COM
** DECTRIS. COM
*** S. Nida, et. al. Silicon carbide X-ray beam position monitors for synchrotron applications J. Synchrotron Rad. 26, 28-35 (2019)
 
 
THAO03 ROSE - a Rotating 4D Emittance Scanner -1
 
  • M.T. Maier, L. Groening, C. Xiao
    GSI, Darmstadt, Germany
  • A. Bechtold
    NTG, Gelnhausen, Germany
  • J.M. Maus
    NTG Neue Technologien GmbH & Co KG, Gelnhausen, Germany
 
  The detector system ROSE, allowing to perform 4D emittance measurements on heavy ion beams independent of their energy and time structure, has been built and successfully commissioned in 2016 at GSI in Darmstadt, Germany. This method to measure the four dimensional emittance has then been granted a patent in 2017. The inventors together with the technology transfer department of GSI have found an industrial partner to modify ROSE into a fully standalone, mobile emittance scanner system. This is a three step process involving the ROSE hardware, the electronics ROBOMAT and the software working packages. The electronics was commissioned at the ECR test bench of the Heidelberg ion therapy facility HIT in June 2019. Currently our main focus is on the development of the 4D software package ROSOFT. This contribution presents the actual status and introduces the multiple possibilities of this 4D emittance scanner.  
 
THAO04 Transverse Emittance Measurement using Undulator High Harmonics for Diffraction Limited Storage Rings -1
 
  • K.P. Wootton, J.L. McChesney, F.M. Rodolakis, N. Sereno, B.X. Yang
    ANL, Lemont, Illinois, USA
 
  Funding: This research used resources of the Advanced Photon Source, operated for the U.S Department of Energy Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.
A particular challenge for diagnostics in diffraction limited storage ring light sources is the measurement of electron beam transverse emittances. In the present work, we present measurements and simulations of vertical electron beam emittance using high harmonics from an electromagnetic undulator in the present Advanced Photon Source storage ring. Based on these results, using simulation we motivate an undulator-based horizontal and vertical transverse emittance monitor for diffraction limited storage rings, using the Advanced Photon Source Upgrade as an example.
 
slides icon Slides THAO04 [2.655 MB]